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TTTC's Electronic Broadcasting
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23rd IEEE International Symposium
on On-Line Testing and Robust System Design |
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CALL FOR PAPERS
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Issues related to On-line testing techniques, and more generally to design for robustness, are increasingly important in modern electronic systems. In particular, the huge complexity of electronic systems has led to growth in reliability needs in several application domains as well as pressure for low cost products. There is a corresponding increasing demand for cost-effective design for robustness techniques. These needs have increased dramatically with the introduction of nanometer technologies, which impact adversely noise margins; process, voltage and temperature variations; aging and wear-out; soft error and EMI sensitivity;power density and heating; and make mandatory the use of design for robustness techniques for extending, yield, reliability, and lifetime of modern SoCs. Design for reliability becomes also mandatory for reducing power dissipation, as voltage reduction, often used to reduce power, strongly affects reliability by reducing noise margins and thus the sensitivity to soft-errors and EMI, and by increasing circuit delays and thus the severity of timing faults. There is also a strong relation between Design for Reliability and Design for Security, as security attacks are often fault-based. The International Symposium on On-Line Testing and Robust System Design (IOLTS), is an established forum for presenting novel ideas and experimental data on these areas. The Symposium is sponsored by the IEEE Council on Electronic Design Automation (CEDA) and the 2017 edition is organized by the IEEE Computer Society Test Technology Technical Council, the University of Athens, and the TIMA Laboratory. The topics of interest include (but are not limited to) the following ones:
This year IOLTS puts particular emphasis on the topics of:
IOLTS’17 is held as part of the 2nd Federative Event on Design for Robustness (FEDfRo). For all details about the event see: http://tima.imag.fr/conferences/fedfro/fedfro17/. |
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The IOLTS Committee invites authors to submit papers in the above or related technical areas. Accepted papers and posters will be included in formal Proceedings to be published by the IEEE. Papers must be submitted electronically following the instructions provided at the symposium web site. Papers should be in the standard IEEE conferences double-column format. If accepted, regular papers should be allowed six pages in the IEEE proceedings of IOLTS. |
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Submission deadline: February 28, 2017 Notification of acceptance: April 6, 2017 Camera-ready papers due: May 7, 2017 |
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| Additional Information | |
Submission InformationDimitris Gizopoulos - University of
Athens Dan Alexandrescu - iRoC Technologies General InformationMichael Nicolaidis - TIMA Laboratory
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For more information, visit
us on the web at: http://tima.imag.fr/conferences/iolts
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IOLTS'17 is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC). |
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